粉体行业在线展览
面议
496
Achieve ultimate specimen quality – free from amorphous and implanted layers
Complements FIB technology
Milling without introduction of artifacts
Advanced detector technology for imaging and precise endpoint detection
In situ imaging with ions and electrons
Microscope connectivity for risk-free specimen handling
Adds capability and capacity
Fast, reliable and easy to use
TH-F120
在线折光仪PRB21
ParticleX TC
观世
CELL PAT
FS500全谱直读光谱仪
OES1000
蜂鸟10X42
TD5
Nanocoulter