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仪器简介:
XR-100SDD 硅漂移探测器(SDD)是Amptek 公司X 光探测器系列的**成员,是一代革命性的产品。它 性能高、尺寸小、低成本,使它成为OEM 制造商的理想选择,用于生产从手持式到台式分析仪器。硅漂 移探测器(SDD)实现了极高计数率下优异的能量分辨率。同其它Amptek 公司生产的探测器一样,它被封 装在TO-8 外壳内,所以它的波形因数可直接转换为现有系统所用,兼容Amptek 公司生产的所有配件。
规格:
Detector Type | Silicon Drift Detector (SDD) |
Detector Size | 25 mm2 |
Silicon Thickness | 500 µm, See efficiency curves |
Collimator | Multilayer, click here for more information |
Energy Resolution @ 5.9 keV (55Fe) | 125 - 140 eV FWHM at 11.2 µ peaking time |
Peak to Background | 8200:1 (ratio of counts from 5.9 keV to 2 keV) |
Background Counts | <3 x 10-3/s, 2 keV to 150 keV |
Detector Be Window Thickness | 0.5 mil (12.5 µm), See transmission curves |
Collimator | Internal MultiLayer Collimator (ML). Click here for more information. |
Charge Sensitive Preamplifier | Amptek custom reset preamplifier. |
Gain Stability | <20 ppm/°C (typical) |
XR100SDD Case Size | 3.00 x 1.75 x 1.13 in (7.6 x 4.4 x 2.9 cm) Click here for mechanical dimensions |
XR100SDD Weight | 4.4 ounces (125 g) |
Total Power | <1 Watt |
Warranty Period | 1 Year |
Typical Device Lifetime | 5 to 10 years, depending on use |
Operation conditions | 0°C to +50°C |
Storage and Shipping | Long term storage: 10+ years in dry environment Typical Storage and Shipping: -20°C to +50°C, 10 to 90% humidity non condensing |
主要特点:
• 高计数率:500,000 CPS
• 在 5.9 keV 峰处分辨率可达136 eV 半峰宽
(FWHM)
• 高峰强:背噪 (P/B) 比:7000:1
• 7 mm2 × 450 μm
• 无需液氮
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