该系统对测量和评价薄膜电子和空穴的迁移率非常关键，主要是用于EL元件和太阳能电池。该系统由一个短脉冲激光激发的载流子产生氮模具，高速采样电子，样品室和数据处理系统。我们的防噪声系统和独特的信号处理降低了噪声明显，响应速度快，如纳米二阶和高灵敏度已经达到为了测量电子和空穴的迁移率。更换不同的模具（作为一个选项）模具的激光使系统振荡的波长范围从分子与脉冲宽度缩短600皮秒荧光。除此之外，TOF法测量，可选单位系统能通过FET的方法测量的迁移率（选项）。

原理：

脉冲光照射样品。然后用示波器测量电荷的流动速度

光脉冲照射到薄膜样品，被施加电压到薄膜样品。

主要应用：

测试有机半导体和有机薄膜的载流子迁移率

The Model CMM-250 has been designed to measure the electron and hole mobilities which are very critical to evaluation of the thin film to be used for the EL elements and solar cells. The system consists of a short pulse nitrogen excitation die laser for carrier generation， high speed sampling electronics， sample compartment and data processing system. Our noise prevention system and unique signal processing have reduced noise significantly so that fast response such as nano-second order and high detection sensitivity have been achieved in order to measure the electron and hole mobilities. Changing different die ( as an option ) of the die laser enables the system to oscillate the wavelength range from 337nm to 730nm with pulse width shortened in 600 pico second. In addition to this TOF method measurement， the system with an optional unit is capable to measure mobilities by FET method(option).

Features

? Achievement of time resolution at nano-second enables the system to measure mobility such as 10-7-１0-１cm2/V·sec( this maybe changed depending on the sample and its thickness).

? Easy Operation with probe/sample compartment

? New designed optics and data processing enabled to obtain high SN ratio data

Measurement

Mobility calculation

While checking the measurement data， mobility can be easily calculated.

By putting cursor on the inflection point， mobility can be calculated automatically while seeing the logarithmic converted data.

Signal processing

In addition to noise prevention， our unique signal processing enables the system to calculate very small signal data with large noise. The measurement can be applied to the thinner film or high mobility sample， which extends the measurement range.

FET Measurement ( Option )

Adding the optional probe and software to the system is enabled to measure mobility measurement for FET type element.